The introduction of large area silicon drift detectors (SDD) detectors with excellent light element performance has greatly improved the EDS analysis prospects for beam sensitive and cryogenically frozen samples. By installing multiple detectors on the same microscope, it is possible to further expand the capabilities of these highly sensitive spectrometers.
The high collection efficiency allows users to analyse cryogenic samples accurately and quickly, maximising count rates at low kV and small spot sizes and with minimum beam damage.
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*Please note, this application note refers to X-Max. This has since been upgraded to Ultim Max.点击下载应用报告