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Ultim® Max

Ultim Max是新一代硅漂移型探测器(SDD),配有大面积晶体和低噪音电子元器件,分析速度和探测灵敏性都有大幅提升。


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Ultim Max采集效率可达以往的17倍,而且不会降低精度。无论您是想做更大区域的面扫描,或者在每个点分析中获得更好的统计数据,更快地采集数据,还是研究最小的纳米结构,Ultim Max都是SEM中X射线分析的理想工具。

速度 - 低噪音电子元器件和X4脉冲处理器的结合,使Ultim Max能够在1,500,000 cps的计数率下对样品进行面分析,并在400,000 cps计数率下进行精确定量。

灵敏度 - 晶体尺寸有着很大影响。使用Ultim Max的大面积晶体(100 mm2和170 mm2),可大幅提高极端分析条件下的计数率。

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AZtecLive & Ultim Max

AZtecLive通过实时化学成像将EDS技术从静态转推向动态,它需要搭配新一代Ultim Max进行工作,在提高效率的同时增加探测灵敏度。    

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Ultim Max TEM

Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM.

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Ultim Extreme

The Ultim Extreme is a windowless 100 mm2 version of Ultim designed to maximise sensitivity and spatial resolution. It uses a radical geometry to optimise both imaging and EDS performance in ultra-high resolution FEG-SEMs.

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应用

Fast Characterisation of Minerals with Similar Crystal Structures

Combining electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) techniques for geological sample characterisation, helps to unlock even more information on the likely formation and history of the sample.

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The Complete Characterisation of Additive Manufacturing Powders with AZtecAM

Investigate the streamlined process through the dedicated AZtecAM software recipe, for complete characterisation of all aspects of metal powders used in additive manufacturing. Ensure the characterisation, particle morphology and individual particle characterisation.

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