为什么高灵敏度对于释放基于CMOS的EBSD探测器的效率至关重要

The Complementary Metal Oxide Semiconductor (CMOS)-based Symmetry electron backscatter diffraction (EBSD) detector halts the need to compromise data quality when analysing at high speeds: it delivers good quality, distortion-free EBSD patterns at exceptional speeds and with sufficient pixel resolution to ensure good indexing and high angular precision even on the most challenging samples.

With CMOS-based EBSD detectors, there is no need to compromise data quality when analysing at high speeds. This short technical bulletin demonstrates the need for high sensitivity in an EBSD detector.

By downloading this short technical bulletin you will see:

•  demonstration of the necessity for high sensitivity in an EBSD detector.
  
• The performance of the Symmetry® CMOS EBSD detector using standard electron beam conditions.

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