Analysing Polymer Additives

SEM中EDS分析高空间分辨率和低能端性能。将Extreme电子电路、无窗设计与几何结构和传感器的优化设计相结合，灵敏度比传统大面积SDD高15倍。

The compact Xplore Silicon Drift Detector (SDD) is the ideal detector for routine EDS analysis in the SEM. The introduction of Xplore complements Oxford Instruments comprehensive…