产品
FIB-SEM
Nanomanipulators
OmniProbeOmniProbe Cryo软件
AZtec3DAZtecFeatureAZtec LayerProbeTEM
Hardware
EDSUltim MaxXploreImaging
软件
AZtecTEM
Detailed surface analysis of samples which are extremely large in size and contain a distribution of object sizes from micro- to nano-scale can pose a challenge when faced with a limited analysis time. Obtaining elemental maps at low magnifications by conventional analysis at relatively low pixel density can misrepresent the chemical and structural composition.
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